Degradation of direct-tunneling gate oxide under hot hole injection
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems
سال: 2001
ISSN: 0385-4221,1348-8155
DOI: 10.1541/ieejeiss1987.121.3_492